Domestic Core-1K High Resolution
Short-wave infrared array industrial cameras
Product Features:
-Uses InGaAs chips and supports the 900-1700nm band.
Spectrograms:
-Line frequency up to 18K.
-Economic, high performance, low cost.
-High sensitivity, high stability, easy integration.
Product Parameters:
Sensor Types: | InGaAs | Target Size: | 12.8×0.0125mm |
Effective Pixels: | 1024×1 | Pixel Size: | 12.5um×12.5um |
Exposure Methods: | Frame Exposure | Maximum Gain: | 16 |
Exposure Time Ranges: | 0.005ms-50ms | Sensitivity: | ≥0.8(A/W) |
Trigger Mode: | Continuous/Software Trigger/Frame Trigger/Line Trigger/Conditional Line Trigger | ||
Video Output Format & Maximum Line Frequency: | Mono 8/12 bit : 18 K |
Use cases and advantages:
Hidden crack detection for photovoltaic panels
Crystalline silicon solar cell production is subject to defects such as hidden cracks and scratches that affect efficiency and lifetime, and these defects are usually difficult to detect with the naked eye or visible light. Using electroluminescence (EL) and photoluminescence (PL) properties, the cell can be made to emit short-wave infrared light by applying a positive bias or laser irradiation. The luminescence of the defective area is different from that of the normal area, so a short-wave infrared camera can be used to detect the cell in the excited state and effectively identify internal defects.
Advantages of Line Array Shortwave Infrared
Advantage 1: Compared with conventional short-wave red outside array industrial cameras, the price is significantly reduced.
Advantage 2: Line array camera scanning inspection, more suitable for wide inspection scenes.
Advantage 3: The line array shortwave infrared camera MV-GEL10I can detect more defects than conventional line array cameras.
Line array short-wave infrared industrial cameras utilize the transmittance of short-wave infrared light to materials and are widely used in semiconductor defect detection and other fields. In the semiconductor industry, line array short-wave infrared industrial cameras can be used for silicon ingot flaw detection, silicon ingot impurity detection and silicon wafer hidden crack detection.
Product Applications: